Semiconductor engineering expert with over 14 years of experience at Samsung Electronics, specializing in yield improvement and defect analysis for DRAM and HBM technologies. Defect expert who directly analyzes and improves semiconductor process and equipment defects. Has a proven track record of industry-first innovations through TF activities such as EUV DRAM and 10nm 2nd generation DRAM development. Has extensive experience applying engineering principles to real-world problems in manufacturing, not just semiconductors, to drive impactful solutions and improve operational efficiency. Seasoned engineering professional known for innovating and solving complex technical challenges, delivering high-quality solutions, and driving team success through effective collaboration and adaptability. Skills include systems analysis, project management, and technical troubleshooting.
Reliable and adaptable, with the ability to learn and apply new skills quickly. Dedicated to leveraging these qualities to drive team success and contribute to the growth of the organization.