
Semiconductor engineer with strong problem-solving skills and leadership experience. Expertise in scanning electron microscopy with 10+ years of industry experience in semiconductor yield enhancement and inspection. Consistently identified as a high performer with excellence in both technical and interpersonal skills. Demonstrated track record of continuous improvement, adaptability, and promotions. Curious and questioning individual who is passionate about learning, sourcing and understanding issues, and creating efficiency. Seeking an opportunity as an Defect Metrology Engineer at Intel to deepen my engineering experience.