Summary
Overview
Work History
Education
Skills
Accomplishments
Certification
Timeline
Generic

JOSE FLORES

Hillsboro,OR

Summary

Results-driven technician with extensive experience at Intel, specializing in 2D dimensional measurement and defect analysis. Proven ability to enhance team efficiency through effective training and mentoring. Skilled in implementing statistical process control, ensuring high-quality standards in semiconductor metrology and hardware testing. Strong collaborator with a focus on continuous improvement.

Overview

32
32
years of professional experience
1
1
Certification

Work History

300mm Semiconductor Metrology Technician

Intel
09.2005 - Current
  • Assisted in performing calibration and maintenance of measurement equipment.
  • Learned to operate precision measuring tools and inspection devices effectively.
  • Collaborated with team members to ensure adherence to safety protocols and quality standards.
  • Supported data collection and analysis for measurement accuracy assessments.

Assistant Supervisor

York Capacitor
01.2000 - 07.2005
  • Oversaw daily operations, ensuring adherence to company policies and procedures.
  • Trained and mentored new staff on operational best practices and safety protocols.
  • Streamlined workflow processes, enhancing team efficiency and productivity.
  • Conducted regular performance evaluations, providing constructive feedback for improvement.

Development Test Technician

IBM
07.1993 - 07.1999
  • Conducted thorough testing of hardware components to ensure functionality and compliance with specifications.
  • Collaborated with engineering teams to troubleshoot and resolve technical issues during product development phases.
  • Developed detailed test plans and procedures to enhance testing efficiency and accuracy across multiple projects.
  • Mentored junior technicians in best practices for equipment handling, safety protocols, and troubleshooting techniques.

Education

Bachelor of Science - Electrical Engineering

University of Vermont
Burlington, VT

Associate of Applied Science - Electronics

College of Aeronautics La Guardia Airport
La Guardia Airport New York City, NY

Skills

  • 2D dimensional measurement
  • Thin film measurement
  • Defect inspection and analysis
  • Implementation of statistical process control

Accomplishments

Safety Person of the month

Technician of the month

Certification

FCC with Radar endorsement

Timeline

300mm Semiconductor Metrology Technician

Intel
09.2005 - Current

Assistant Supervisor

York Capacitor
01.2000 - 07.2005

Development Test Technician

IBM
07.1993 - 07.1999

Bachelor of Science - Electrical Engineering

University of Vermont

Associate of Applied Science - Electronics

College of Aeronautics La Guardia Airport

Similar Profiles

CREATE PROFILE