
I am a Design-for-Test (DFT) Engineer specializing in developing and implementing DFT architectures for complex SoC and VLSI designs. With hands-on experience in scan insertion, ATPG, MBIST, boundary scan (IEEE 1149.1/1149.6), and silicon bring-up, I excel at ensuring testability, manufacturability, and high fault coverage. My background spans across DFT implementation, verification, ATE debug, and post-silicon validation with focus on yield optimization, timing closure, and test automation using Python, TCL, and Perl scripting.
Results-driven engineering professional with focus on product development and innovation. Known for driving impactful projects and delivering high-quality solutions. Strong emphasis on team collaboration and adaptability to changing requirements. Proficient in problem-solving and product lifecycle management.