
Senior Process Engineer with 8 years of semiconductor experience specializing in ALD metal deposition and NAND memory device testing. Proven contributor to high volume manufacturing environments, with a strong record of improving yield, reliability, and throughput through data-driven process optimization. Experienced in transferring ALD metal processes from R&D to production and supporting large-scale equipment upgrades. Deep expertise in SPC, DOE, root cause analysis, and process integration for memory technologies. Recognized for hands-on troubleshooting, rapid issue resolution, and effective collaboration with device, integration, and manufacturing teams.
Institute of Electrical and Electronics Engineers