Motivated and detail-oriented researcher Materials Science with hands-on experience in Atomic Force Microscopy (AFM), including Piezoresponse Force Microscopy (PFM), Kelvin Probe Force Microscopy (KPFM), and Tapping Mode for nanoscale characterization. Skilled in data analysis, simulation tools, and research methodologies, with strong problem-solving and teamwork abilities. Eager to apply technical expertise and gain industry insights through the Industrial Mentorship Program, while contributing enthusiasm, adaptability, and a commitment to professional growth.