I've been working as semiconductor test systems' (ATE) application engineer throughout 4 decades of my career.
I've gain knowledge the devices (logic and memory), test methodology.
I'm good at working with customers, good communications and my technical skills make customers trust my ability.
I'm fluent in Japanese, as well as English.
As a factory application engineer for the Multi Protocol SSD system level tester;
- I've supported multiple customers, helped and worked with the field application engineers.
I've contributed the success of business with Apple, Seagate, LiteOn, YMTC, Kioxia, and others.
- Worked with R&D team for new features verifications, characterization
- Worked with QA team for SW release validations
- Developed training materials for the system, new features
First couple of years in Advantest, I've supported Flash memory test systems as senior application engineer.
As a factory application engineer for Flash Memory test systems;
- I've worked with Sales/Marketing for pre-sales activities.
- Also worked with R&D for new development, characterization, verifications.
- Developed training materials, presentation materials
I've done benchmark for multiple customers as pre-sales activity
Support customers, developed test programs, troubleshooted production issues, working with field application engineers.
As a factory application engineer for Flash Memory Test systems;
- I've worked with Sales/Marketing for pre-sales activities.
- Also worked with R&D for the new system characterization and verification.
- Developed training materials and presentation materials
As a factory application engineer for Flash Memory Test system;
- I've worked on pre-sales/post-sales
- developed test programs, troubleshoot customer's production issues on site
- developed training material.
I also worked as a factory application engineer for High Speed memory (target devices are DDR and Rambus) test system from 1998 to 1999.
Supported (pre-sales/post-sales, application support) for multiple US products, such as Verisys High Speed test system, Schlumberger logic test systems, Versatest Flash Memory test systems, in Japan.
Developed test programs for ICs, converted test programs from one tester to the other vendor's tester.
Supported multiple customer for test program development, test program conversion, production issue troubleshoot.
Worked as a contractor.
Supported GenRad test systems, that imported from US.
Worked as a contractor.
Test program conversion from Fairchild Sentry Test systems to Ando Test systems.
Granted United States Patent:
11,041,907
10,634,723