Summary
Overview
Work History
Education
Skills
Websites
Accomplishments
Languages
Timeline
Generic

Shunji Tachibana

San Jose,CA

Summary

I've been working as semiconductor test systems' (ATE) application engineer throughout 4 decades of my career.

I've gain knowledge the devices (logic and memory), test methodology.

I'm good at working with customers, good communications and my technical skills make customers trust my ability.
I'm fluent in Japanese, as well as English.

Overview

41
41
years of professional experience

Work History

Application Consulting Manager

Advantest America, Inc.
01.2012 - 03.2024

As a factory application engineer for the Multi Protocol SSD system level tester;

- I've supported multiple customers, helped and worked with the field application engineers.

I've contributed the success of business with Apple, Seagate, LiteOn, YMTC, Kioxia, and others.

- Worked with R&D team for new features verifications, characterization

- Worked with QA team for SW release validations

- Developed training materials for the system, new features


First couple of years in Advantest, I've supported Flash memory test systems as senior application engineer.


Senior Application Engineer/Application Manager

Verigy Ltd
01.2006 - 12.2011

As a factory application engineer for Flash Memory test systems;

- I've worked with Sales/Marketing for pre-sales activities.

- Also worked with R&D for new development, characterization, verifications.

- Developed training materials, presentation materials


I've done benchmark for multiple customers as pre-sales activity

Support customers, developed test programs, troubleshooted production issues, working with field application engineers.



Senior Application Engineer

Agilent Technolgies
01.2000 - 12.2005

As a factory application engineer for Flash Memory Test systems;

- I've worked with Sales/Marketing for pre-sales activities.

- Also worked with R&D for the new system characterization and verification.

- Developed training materials and presentation materials



Senior Application Engineer

Hewlett Packard
01.1996 - 12.1999

As a factory application engineer for Flash Memory Test system;

- I've worked on pre-sales/post-sales

- developed test programs, troubleshoot customer's production issues on site

- developed training material.



I also worked as a factory application engineer for High Speed memory (target devices are DDR and Rambus) test system from 1998 to 1999.


Assistant Section Manager

Innotech Corp
01.1991 - 12.1995

Supported (pre-sales/post-sales, application support) for multiple US products, such as Verisys High Speed test system, Schlumberger logic test systems, Versatest Flash Memory test systems, in Japan.


Application Engineer

KMEGA Technology
10.1989 - 12.1990

Developed test programs for ICs, converted test programs from one tester to the other vendor's tester.


Application Engineer

ATE Service
01.1985 - 09.1989

Supported multiple customer for test program development, test program conversion, production issue troubleshoot.

Application Engineer

Tokyo Electron Limited
01.1984 - 12.1984

Worked as a contractor.

Supported GenRad test systems, that imported from US.

Test Engineer

NEC
04.1983 - 12.1983

Worked as a contractor.

Test program conversion from Fairchild Sentry Test systems to Ando Test systems.

Education

Associate of Science - Electrical Engineering

NEEC
Tokyo, Japan
03.1983

Skills

  • PCIe/NVMe
  • Flash Memory Technology
  • C Language
  • Semiconductor device testing methodology

Accomplishments

Granted United States Patent:

11,041,907

10,634,723


Languages

Japanese
Native or Bilingual

Timeline

Application Consulting Manager

Advantest America, Inc.
01.2012 - 03.2024

Senior Application Engineer/Application Manager

Verigy Ltd
01.2006 - 12.2011

Senior Application Engineer

Agilent Technolgies
01.2000 - 12.2005

Senior Application Engineer

Hewlett Packard
01.1996 - 12.1999

Assistant Section Manager

Innotech Corp
01.1991 - 12.1995

Application Engineer

KMEGA Technology
10.1989 - 12.1990

Application Engineer

ATE Service
01.1985 - 09.1989

Application Engineer

Tokyo Electron Limited
01.1984 - 12.1984

Test Engineer

NEC
04.1983 - 12.1983

Associate of Science - Electrical Engineering

NEEC
Shunji Tachibana