Semiconductor professional with over 27 years of experience and proven track record of delivering CMOS logic and access transistors for Logic and Memory technologies. I am highly skilled in device analysis, transistor device design, implant engineering, high-k metal gate-dipole engineering, GAA, WF engineering, and contact silicide formation for memory technology. An innovative and hands-on technologist with a passion for problem-solving that blends R&D experience with business goals.
1x-nm process node CMOS ownership from device design to implant engineering for meeting performance and reliability requirements.
· Worked with cross-functional teams - Design, Product Engineering, Si Modeling, and Quality to understand issues, targets, and priorities.
· Delivered periphery CMOS technology for 1x-nm DRAM that met performance requirements under severe array efficiency requirement and thermal budget constraints for sense-amplifier and row-driver devices.
· Tackled major transistor reliability (row-drivers) and mismatch (sense-amp) requirements.
· Developed a thermally stable silicide technology for contact silicide using proprietary stack materials with improved scalability down to 20-nm wide contacts.
· Extracted, monitored, analyzed, and reacted to inline data, param data and probe data to fix yield issues. Drove performance and reliability metrics to add process margin and/or reduce costs.
· Performed path-finding exploration for gate oxide scaling using high-k metal gate integration for DRAM periphery.
Contributed as CMOS and access device engineer for three memory generations including the industry’s first 6F2 architecture DRAM built by Micron.
· Developed gate doping techniques for recess gate access device (RAD).
· Developed CMOS devices from design specifications to silicon verification, model generation, and reliability for various DRAM process nodes.
· Developed novel implant and structural changes to improve CMOS performance and scalability – innovations include dual-composite spacers for pitch and periphery CMOS, multi-level enhancement-based VT tuning.