

as well as experience in several technique related to my research on effect of Aluminum thickness on aluminum - induced crystallization of hydrogen type P amorphous silicon ( a-Si :H(P) )
During this research i worked with these techniques :
PEVCD
RAMAN spectroscopy
X-ray diffraction (XRD)
SEM Scanning Electron Microscope
an online non-credit course authorized by Arizona State University and offered through Coursera
an online non-credit course authorized by Arizona State University and offered through Coursera
an online non-credit course authorized by Arizona State University and offered through Coursera
an online non-credit course authorized by Arizona State University and offered through Coursera