Jade Flores

• Managed the on-site technical uptime, optimization, and preventative maintenance of highly advanced photolithography EUV light sources inside fast-paced, high-volume semiconductor fabrication facilities.
• Performed advanced, component-level root-cause analysis on complex vacuum, thermal, and electro-mechanical sub-systems under intense, time-critical constraints to minimize customer tool downtime.
• Documented and tracked systemic tool failures and infant-mortality defects in the field, translating real-world performance data back to factory factory-level QA and NPI teams to drive design-for-reliability (DFR) improvements.
• Served as the primary technical point of contact for premier semiconductor customers; managed expectations, delivered detailed failure reports, and validated tool performance to achieve formal customer buy-off.
• Collaborated with global engineering teams to deploy fields updates, validate engineering change orders (ECOs), and execute localized containment actions for recurring equipment hardware bugs.
• Authored detailed technical service reports documenting tool status, root-cause diagnostics, and uptime metrics to track equipment reliability trends.

Associate Test Engineer I (2019 – 2025)

• Executed comprehensive set-up, calibration, and system-level testing for Onto Innovation IRIS S and Atlas XP+/MPU metrology tools to ensure optimal semiconductor wafer measurement accuracy.
• Configured and deployed custom user options and labeling systems for Atlas III+ and Atlas V tools to meet client-specific technical requirements.
• Authored comprehensive technical escalation reports for engineering support, detailing system logs, error codes, and preliminary troubleshooting steps.
• Mentored and coached assembly and test technicians on advanced calibration procedures and troubleshooting methodologies, elevating the team's collective hardware validation capabilities.
• Served as the primary technical point of contact and escalation resource, guiding team members through complex optical alignment troubleshooting and system-level debugging.

Associate Test Engineer (2015 – 2019)

• Assembled and integrated high-precision sub-assemblies for Atlas II+ and Atlas III / III+ inline OCD metrology tools, including 300mm XY-Theta stages, robotic wafer handlers, and complex optical modules
• Tested, troubleshot, and reworked complex assemblies and final systems using Atlas II+ and Atlas III tools, ensuring all systems met strict quality and operational standards.
• Collaborated closely with manufacturing engineering to identify build-documentation gaps, improving assembly efficiency and stream-lining the production cycle for advanced metrology systems.
• Handled sensitive components under strict cleanroom protocols, ensuring the safe mechanical deployment of high-pressure pneumatics, robotic automation arms, and heavy internal positioning stages.
• Utilized torque wrenches, gauges, and precision measurement instruments to ensure mechanical tolerances met strict sub-micron specifications before passing tools to the final test phase.