Driven graduate offering advanced knowledge in Semiconductor Device Modeling and Physics to add value to a dynamic team. Proven success in working within collaborative environments to drive innovation and advance research. Seeking an Engineering opportunity to assist in driving the company's objectives. Adept at working effectively unsupervised and quickly mastering new skills.
GaN-based PIN Diode for EUV Detection
Designed and simulated a Gallium Nitride (GaN) PIN diode optimized for Extreme Ultraviolet (EUV) photon detection, addressing the need for high sensitivity and reliability in lithography equipment monitoring.
Utilized Synopsys Sentaurus for device simulation, analyzing the effects of GaN material properties on diode performance, including responsivity and dark current characteristics.
Fabricated prototypes in a cleanroom environment, implementing a novel etching process to improve surface quality and device performance.
Conducted experimental validation, demonstrating enhanced EUV detection efficiency compared to traditional silicon-based detectors.
Image Classification Using Convolutional Neural Networks (CNN)
Developed a CNN model to classify images from a dataset of [number] images into [number] distinct categories, using TensorFlow and Keras.
Preprocessed image data for optimal training performance, including normalization, augmentation, and dimensionality reduction techniques.
Implemented transfer learning using VGG16 architecture, fine-tuning the model to achieve 84% accuracy on the validation set.
Memory Device Using Phase Change Material
Led a project to develop a non-volatile memory device using Ge2Sb2Te5 (GST) phase change material, aiming to improve data storage density and speed.
Designed device architecture and conducted simulations to optimize electrical and thermal properties for rapid and reliable phase transitions.
Collaborated with material scientists to fabricate devices, employing sputtering and annealing techniques to achieve desired crystalline structures.
Performed electrical testing to evaluate write-erase cycles, endurance, and data retention capabilities.