Ryan Peachey

• Conduct detailed analysis of competitor RF modules (FEMs), focusing on power amplifier (PA) and low noise amplifier (LNA) design.
• Reconstruct circuit block diagrams from physical teardown and microscopy.
• Perform on-die probing and s-parameter extraction using VNA to evaluate RF filters and components.
• Simulate RF networks using ADS to evaluate matching and filter tuning performance.
• Interface with external vendors to procure and qualify new lab equipment.

· Developed and maintained automated wafer test programs for SAW filter production.

· Designed and implemented tools in C# to automate test spec verification, saving time and reducing human error.

· Spearheaded a LEAN initiative using custom software that cut $3M/year in test fixture costs.

· Created GUIs for editing and analyzing wafer maps asynchronously to enhance workflow speed.

· Conducted statistical analysis and root-cause debugging of test failures using JMP and SQL queries.

· Owned and maintained test documentation; trained fab operators and engineers.

· Performed load-pull and source-pull measurements on Wi-Fi FEMs and amplifiers.

· Designed RF/mixed signal PCBs using Altium Designer, optimizing for impedance and signal integrity.

· Used high-frequency RF probe station for on-die testing and calibration.

· Created a test request system using Microsoft InfoPath, significantly reducing redundant testing and streamlining data turnaround times.

· Soldered and assembled test boards and SMD components for evaluation.