Alireza Moazzeni

Detail-oriented electrical measurement technician with hands-on expertise in advanced electrical testing, microfabrication, and characterization tools. Passionate about ensuring reliable device performance through precise measurement techniques and statistical tools.

• Introduction To Semiconductor Chip Design and Verification, 2024, MEDC Program
• PCB design, 2024, MEDC Program

• AVS 70th travel award, AVS
• Graduate Student Professional Award, Wayne State University, Graduate Office, 2
• AVS Best Poster Award, 2024, AVS Michigan Chapter Spring Symposium
• Rumble fellowship award, Wayne State University
• Ranked Top 1 student of Master of science study in Micro and Nano electronic devices

Switching Characteristic of Fabricated Nonvolatile Bipolar Resistive Switching Memory (ReRAM) using PEDOT: PSS/GO, 2022, 10.1016/j.sse.2021.108208, Solid State Electronics, Fabrication of Graphene Oxide-Based Resistive Switching Memory by the Spray Pyrolysis Technique for Neuromorphic Computing, 2023, 10.1021/acsanm.2c05497, ACS Applied Nano Materials, The Impact of Operation Conditions on Potentiation, Depression and Endurance Dynamics of Tantalum Oxide RRAMs, 2023, 10.1109/IIRW59383.2023.10477696, IEEE International Integrated Reliability Workshop (IIRW)-2023, Engineering the Device Performance of PLD Grown Tantalum Oxide based RRAM Devices, 2023, 10.1109/eIT57321.2023.10187322, International Conference on Electro Information Technology (eit2023)

https://scholar.google.com/citations?user=zEAUUJUAAAAJ&hl=en

• Training the Electrical Measurements with Keysight b1500, Nomad Lab, Wayne State University, 01/01/24, 07/31/24, Dr. Gozde Tutuncuoglu, 2
• Training the Electrical Measurements with Keysight b1500, Nomad Lab, Wayne State University, 01/01/23, 07/31/23, Dr. Gozde Tutuncuoglu, 1

• Awarded AVS Best Poster Award and multiple travel grants for research presentations.